| سال | هفته | ID | Title | ApplNo | IPC | Applicant | Subgroup | زیر گروه | رشته | شرح | Description |
|---|
2025 | 48 | WO/2025/242362 | IMPROVEMENTS TO LITHOGRAPHIC METHODS AND APPARATUS | EP2025/060222 | G03F 7/00 | ASML NETHERLANDS B.V. | PHYSICS | فیزیک | ابزارها | 2025 | 48 | WO/2025/242363 | MASKING MODULE | EP2025/060225 | G03F 7/00 | ASML NETHERLANDS B.V. | PHYSICS | فیزیک | ابزارها | 2025 | 48 | WO/2025/242365 | METHOD FOR CALIBRATING ILLUMINATION OPTICS | EP2025/060469 | G03F 7/00 | ASML NETHERLANDS B.V. | PHYSICS | فیزیک | ابزارها | 2025 | 48 | WO/2025/242380 | SPLIT CHUCK | EP2025/060955 | G03F 7/00 | ASML NETHERLANDS B.V. | PHYSICS | فیزیک | ابزارها | 2025 | 48 | WO/2025/242386 | METHOD OF PREDICTING AN ON PRODUCT EFFECT OF A WAFER LOAD GRID | EP2025/061156 | G03F 7/00 | ASML NETHERLANDS B.V. | PHYSICS | فیزیک | ابزارها | 2025 | 48 | WO/2025/242387 | CALIBRATION SUBSTRATE, METHOD TO DETERMINE AN OFFSET CORRECTION FOR A SUBSTRATE TO BE LOADED ON A SUBSTRATE SUPPORT, COMBINATION OF A SUBSTRATE SUPPORT AND A CALIBRATION SUBSTRATE, AND SUBSTRATE HANDLING APPARATUS | EP2025/061216 | G03F 7/20 | ASML NETHERLANDS B.V. | PHYSICS | فیزیک | ابزارها | 2025 | 48 | WO/2025/242388 | POSITIONING APPARATUS FOR A STAGE APPARATUS | EP2025/061221 | G03F 7/20 | ASML NETHERLANDS B.V. | PHYSICS | فیزیک | ابزارها | 2025 | 48 | WO/2025/242393 | VIBRATION CORRECTION FOR INTERFEROMETRIC OR HOLOGRAPHIC METROLOGY | EP2025/061441 | G03F 7/00 | ASML NETHERLANDS B.V. | PHYSICS | فیزیک | ابزارها | 2025 | 48 | WO/2025/242396 | WAFER-LEVEL SELECTION FOR ENHANCED INLINE INSPECTION IN SEMICONDUCTOR MANUFACTURING | EP2025/061519 | G03F 7/00 | ASML NETHERLANDS B.V. | PHYSICS | فیزیک | ابزارها | 2025 | 48 | WO/2025/242413 | SYSTEMS, METHODS, AND SOFTWARE FOR PHASE-BASED ALIGNMENT SENSORS | EP2025/061996 | G03F 7/20 | ASML NETHERLANDS B.V. | PHYSICS | فیزیک | ابزارها | 2025 | 48 | WO/2025/242414 | SUBSTRATE ALIGNMENT SYSTEM | EP2025/061997 | G03F 9/00 | ASML NETHERLANDS B.V. | PHYSICS | فیزیک | ابزارها | 2025 | 48 | WO/2025/242415 | SYSTEMS, METHODS, AND SOFTWARE FOR MODEL-BASED COMBINED ALIGNMENT AND OVERLAY METROLOGY | EP2025/061998 | G03F 7/20 | ASML NETHERLANDS B.V. | PHYSICS | فیزیک | ابزارها | 2025 | 48 | WO/2025/242581 | METHOD AND SYSTEM FOR DETERMINING A POSITION SENSOR ERROR | EP2025/063644 | G03F 7/00 | MYCRONIC AB | PHYSICS | فیزیک | ابزارها | 2025 | 48 | WO/2025/242638 | OPTICAL ASSEMBLY, METHOD FOR INTEGRATING OPTICAL ASSEMBLY, AND PROJECTION EXPOSURE APPARATUS | EP2025/063765 | G03F 7/00 | CARL ZEISS SMT GMBH | PHYSICS | فیزیک | ابزارها | 2025 | 48 | WO/2025/243400 | PHOTOSENSITIVE RESIN COMPOSITION, PHOTOSENSITIVE ELEMENT, CURED PRODUCT, METHOD FOR MANUFACTURING CURED PRODUCT PATTERN, AND METHOD FOR MANUFACTURING CONDUCTOR PATTERN | JP2024/018704 | G03F 7/027 | RESONAC CORPORATION | PHYSICS | فیزیک | ابزارها | 2025 | 48 | WO/2025/243633 | LIGHT SOURCE DEVICE AND ENERGY BEAM INTRODUCTION MEMBER | JP2025/006468 | G03F 7/20 | USHIO DENKI KABUSHIKI KAISHA | PHYSICS | فیزیک | ابزارها | 2025 | 48 | WO/2025/243649 | PHOTOSENSITIVE RESIN COMPOSITION, PHOTOSENSITIVE ELEMENT, CURED PRODUCT, METHOD FOR MANUFACTURING CURED PRODUCT PATTERN, AND METHOD FOR MANUFACTURING CONDUCTOR PATTERN | JP2025/008837 | G03F 7/027 | RESONAC CORPORATION | PHYSICS | فیزیک | ابزارها | 2025 | 48 | WO/2025/243662 | POSITIVE RESIST MATERIAL AND PATTERN-FORMING METHOD | JP2025/010157 | G03F 7/039 | RESONAC CORPORATION | PHYSICS | فیزیک | ابزارها | 2025 | 48 | WO/2025/243704 | RADIATION-SENSITIVE COMPOSITION, PATTERN-FORMING METHOD, AND COMPOUND | JP2025/013646 | G03F 7/004 | JSR CORPORATION | PHYSICS | فیزیک | ابزارها | 2025 | 48 | WO/2025/243768 | RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN | JP2025/015752 | G03F 7/039 | TOKYO OHKA KOGYO CO., LTD. | PHYSICS | فیزیک | ابزارها | 2025 | 48 | WO/2025/243876 | SUBSTRATE TREATMENT METHOD AND SUBSTRATE TREATMENT DEVICE | JP2025/017203 | G03F 7/32 | TOKYO ELECTRON LIMITED | PHYSICS | فیزیک | ابزارها | 2025 | 48 | WO/2025/243892 | RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN | JP2025/017372 | G03F 7/004 | TOKYO OHKA KOGYO CO., LTD. | PHYSICS | فیزیک | ابزارها | 2025 | 48 | WO/2025/243930 | PHOTOSENSITIVE RESIN COMPOSITION, PHOTOSENSITIVE COLORING COMPOSITION, AND COLOR FILTER | JP2025/017733 | G03F 7/033 | RESONAC CORPORATION | PHYSICS | فیزیک | ابزارها | 2025 | 48 | WO/2025/243956 | RADIATION-SENSITIVE COMPOSITION AND RESIST PATTERN FORMATION METHOD | JP2025/017899 | G03F 7/004 | JSR CORPORATION | PHYSICS | فیزیک | ابزارها | 2025 | 48 | WO/2025/244102 | RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN | JP2025/018592 | G03F 7/004 | TOKYO OHKA KOGYO CO., LTD. | PHYSICS | فیزیک | ابزارها | 2025 | 48 | WO/2025/244138 | SACRIFICIAL FILM-FORMING COMPOSITION AND METHOD FOR PRODUCING SACRIFICIAL FILM PATTERN | JP2025/018817 | G03F 7/023 | OSAKA ORGANIC CHEMICAL INDUSTRY LTD. | PHYSICS | فیزیک | ابزارها | 2025 | 48 | WO/2025/244887 | INSPECTION DEVICE WITH METASURFACE POLARIZATION BEAM SPLITTER | US2025/029234 | G03F 1/84 | CORNING INCORPORATED | PHYSICS | فیزیک | ابزارها |